Degrees

Ph.D. Mechanical Engineering, University of California, Berkeley, May 2001
M.S. Mechanical Engineering, Arizona State University, Tempe, August 1997
B.E. Thermal Engineering, Tsinghua University, Beijing, July 1991

Research/Teaching Interests

Dr. Shi's research interests are in the interdisciplinary areas of Nanomaterials, Nanoscale Heat Transfer, Microfluidics, and Micro/Nano Electromechanical Systems (MEMS/NEMS), with applications in clean energy technologies, microelectronics, and chemical and biomolecular sensors and devices. His research group investigates thermal-fluids and materials problems in small length/time scales and develops novel miniaturized sensors with the use of experimental techniques including micro-nano fabrication, nanomaterials synthesis, scanning probe microscopy, and mesoscopic transport measurements. Dr. Shi is a faculty member of the Thermal/Fluid Systems program of the Mechanical Engineering Department. He has served on the College of Engineering faculty since 2002. Dr. Shi is also a fellow of the Center for Nano and Molecular Science and Technology in the University of Texas at Austin Texas Materials Institute. He received a CAREER award from the National Science Foundation (NSF) for his work on thermal transport and thermoelectric measurements of nanotransistors, nanowires, and superlattices in 2003, and a Young Investigator Award from the Office of Naval Research for research of nanostructured thermoelectric materials in 2004. He received an Outstanding Reviewer Award from the ASME Journal of Heat Transfer, which honors those reviewers who have made exemplary contributions to the Journal.

1. Nanostructured Thermoelectric and Electronic Materials.
2. Thermal Transport in Nano- Materials and Devices.
3. Nanobiotechnology, MEMS, and Microfluidics.

Courses Taught:

1. ME 339 Heat Transfer
2. ME 139L Heat Transfer Laboratory
3. ME 381R Micro-Nano Scale Thermal-Fluid Science and Technology

Publications

Book Chapters:

1. C. Yu and L. Shi, "BioMEMS Devices in Cell Manipulation--Micro-flow Cytometry and Applications," to appear in BioMEMS Devices and Systems, ed. W. Wang and S. Soper.
2. L. Shi, "Scanning Thermal and Thermoelectric Microscopy," in Microscopy for Nanotechnology, ed. N. Yao and Z. L. Wang, pp.183-205, Kluwer Academic Publisher (2005).
3. L. Shi and A. Majumdar, "Micro-Nano Scale Thermal Imaging Using Scanning Probe Microscopy," in Applied Scanning Probe Methods, ed. H. Fuchs, S. Hosaka, and B. Bhushan, pp.327-362, Springer (2003).

Archival Journal Articles:

1. C. Yu, S. Saha, J. Zhou, L. Shi, A. M. Cassell, B. A. Cruden, Q. Ngo, J. Li, "Thermal Contact Resistance and Thermal Conductivity of a Carbon Nanofiber," Journal of Heat Transfer, Vol. 128, 234-239 (2006).
2. L. Shi, C. Yu, J. Zhou, "Thermal Characterization and Sensor Applications of One-Dimensional Nanostructures Employing Microelectromechanical Systems," J. Phys. Chem. B, Vol. 109, 22102-22111 (2005) (feature article).
3. J. Zhou, Q. Jin, J. H. Seol, X. Li, L. Shi, "Thermoelectric Properties of Individual Electrodeposited Bismuth Telluride Nanowires," Appl. Phys. Lett., Vol. 87, 133109:1-3 (2005).
4. C. Yu, L. Shi, Z. Yao, D. Li, A. Majumdar, "Thermal Conductance and Thermopower of an Individual Single-Wall Carbon Nanotube," Nano. Lett., Vol. 5, 1842-1846 (2005).
5. Z. Bian, A. Shakouri, L. Shi, H.-K. Lyeo, C. K. Shih, "Three-Dimensional Modeling of Nanoscale Seebeck Measurement by Scanning Thermoelectric Microscopy," Appl. Phys. Lett., 87, 053115:1-3 (2005).
6. P. Schelling, L. Shi, K. E. Goodson, "Managing Heat for Electronics," Materials Today, 8, 30-35 (2005) (feature review).
7. C. Yu, J. Vykoukal, D. Vykoukal, J. Schwartz, L. Shi, P. R. C. Gascoyne, "A Three-Dimensional Dielectrophoretic Particle Focusing Channel for Micro-Cytometry Applications," J. Microelectromechanical Systems, 14, 480-487 (2005).
8. C. Yu, Q. Hao, S. Saha, L. Shi, X. Kong, Z. L. Wang, "Integration of Metal Oxide Nanobelts with Microsystems for Nerve Agent Detection," Appl. Phys. Lett., 86, 063101:1-3 (2005) (featured on the issue cover).
9. L. Shi, Q. Hao, C. Yu, N. Mingo, X. Kong, Z. L. Wang, "Thermal Conductivities of Individual Tin Dioxide Nanobelts," Appl. Phys. Lett., 84, 2638-2640 (2004).
10. H.-K. Lyeo, A. A. Khajetoorians, L. Shi, K. P. Pipe, R. J. Ram, A. Shakouri, C. K. Shih, "Profiling the Thermoelectric Power of Semiconductor Junctions with Nanometer Resolution," Science, 303, 818-820 (2004).
11. J. P. Small, L. Shi, P. Kim, "Mesoscopic Thermal and Thermoelectric Measurements of Individual Carbon Nanotubes," Solid State Comm., 127, 181-186 (2003).
12. O. Kwon, L. Shi, and A. Majumdar, "Scanning Thermal Wave Microscopy," J. Heat Transfer, 125, 156-163 (2003).
13. P. Kim, L. Shi, A. Majumdar, P. L. McEuen, "Mesoscopic Thermal Transport and Energy Dissipation In Carbon Nanotubes," Physica B, 323, 67-70 (2002).
14. U. Ghoshal, S. Ghoshal, C. McDowell, L. Shi, S. Cordes, M. Farinelli, "Enhanced Thermoelectric Cooling at Cold Junction Interfaces," Appl. Phys. Lett., 80, 3006-3008 (2002).
15. L. Shi and A. Majumdar, "Thermal Transport Mechanisms at Nanoscale Point Contacts," J. Heat Transfer,124, 329-337 (2002).
16. P. Kim, L. Shi, A. Majumdar, P. L. McEuen, "Thermal Transport Measurements of Individual Multiwalled Carbon Nanotubes," Phy. Rev. Lett., 87, 215502:1-4 (2001).
17. L. Shi, O. Kwon, A. Miner, and A. Majumdar, "Design and Batch Fabrication of Probes for Sub-100 nm Scanning Thermal Microscopy," J. Microelectromechanical Systems, 10, 370-378 (2001).
18. L. Shi and A. Majumdar, "Recent Development in Micro and Nanoscale Thermometry," Microscale Thermophyscial Eng., 5, 251-265 (2001) (invited review).
19. L. Shi, S. Plyasunov, A. Bachtold, P. L. McEuen, and A. Majumdar, "Scanning Thermal Microscopy of Carbon Nanotubes using Batch-Fabricated Probes," Appl. Phys. Lett., 77, 4295-4298 (2000).

Patents:

1. US Patent 6,652,139, "Scanning Heat Flow Probe and the Method of Fabricating the Same," S. Cordes, D. R. DiMilia, J. P. Doyle, M. J. Farinelli, S. Ghoshal, U. Ghoshal, C. T. McDowell, L. Shi.
2. US Patent 6,679,625, "Scanning Heat Flow Probe," S. Cordes, D. R. DiMilia, J. P. Doyle, M. J. Farinelli, S. Ghoshal, U. Ghoshal, C. T. McDowell, L. Shi.
3. US Patent 6,893,884, "Method and Apparatus for Measuring Dopant Profile of a Semiconductor," L. Shi, U. Ghoshal.
4. US Patent 6,724,221, "Circuitry Having Exclusive-OR AND Latch Function, and Method Therefore," J.-A. Carballo, D. W. Boerstler, J. L. Burns, K. J. Nowka, L. Shi.

 

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