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4. US Patent 6,652,139, "Scanning Heat Flow Probe and the Method of Fabricating the Same," S. Cordes, D. R. DiMilia, J. P. Doyle, M. J. Farinelli, S. Ghoshal, U. Ghoshal, C. T. McDowell, L. Shi

3.  US Patent 6,866,415, 6,817,761, 6,679,625, "Scanning Heat Flow Probe," S. Cordes, D. R. DiMilia, J. P. Doyle, M. J. Farinelli, S. Ghoshal, U. Ghoshal, C. T. McDowell, L. Shi

2.  US Patent 6,893,884, "Method and Apparatus for Measuring Dopant Profile of a Semiconductor," L. Shi, U. Ghoshal

1.  US Patent 6,724,221, "Circuitry Having Exclusive-OR AND Latch Function, and Method Therefore," J.-A. Carballo, D. W. Boerstler, J. L. Burns, K. J. Nowka, L.  Shi